연도 2006 
저널명 한국진공학회지 

한국진공학회||2006||15||3||246||258||정경재, 최재명, 황휘동, 김곤호, 고광철, 황용석||한국||

 

음의 고전압의 인가에 따라 반응하는 동적 플라즈마를 부하로 갖는 PSII(plasma source ion implantation) 펄스 시스템을 분석하기 위한 회로 모델을 개발하였다. 플라즈마 내에 삽입된 평판 전극 앞에서의 플라즈마 쉬스의 움직임은 동적 차일드-랑뮤어 쉬스 모델을 따르는 것으로 가정하였다. 표적 전극에 흐르는 전류는 전극에 인가되는 전압과 서로 영향을 주며 변하므로 동적 플라즈마 부하를 전압 의존 전류 원으로 표현하여 자기모순이 없는 회로 모델을 구현하였다. 회로 해석은 Pspice 프로그램을 이용하여 수행하였으며, 다양한 플라즈마 조건과 펄스인가 조건에서의 실험 결과와 비교하여 회로 모델의 타당성을 검증하였다.

A circuit model has been developed to analyze characteristics of the PSII(plasma source ion implantation) pulse system with dynamic plasma load. The plasma sheath in front of the immersed planar target biased with a negative-high voltage pulse is assumed to be governed by the dynamic Child-Langmuir sheath model. Target current is self-consistently varied with the applied voltage by using the voltage-controlled current source in the circuit model. Circuit simulations are conducted with Pspice circuit simulator, and simulated pulse currents and voltages on the target are compared and confirmed with experimental results for various voltage pulses and plasma conditions.



 

연도 저널명 제목 조회 수
2006  Japanese Journal of Applied Physics  Investigation of Current on the Conducting Target Biased with a Large Negative Potential in the Non-Uniform Plasma 4536
2006  Journal of the Korean Physical Society  Capacitance Between an Atmospheric Discharge Plasma and the Dielectric Electrode in the Parallel Cell Reactor 6535
2006  Journal of the Korean Physical Society  Optimum Operating Frequency of an Atmospheric-Pressure Dielectric-Barrier Discharge for the Photo-Resistor Ashing Process 7306
2006  Journal Of The Korean Physical Society  Plasma Density Monitoring Based on the Capacitively- and Inductively-Coupled-Plasma Models 5697
2006  한국진공학회지  PSII 펄스 시스템의 동적 플라즈마 부하 회로 모델 개발 8453
2004  Plasma Science, IEEE Transactions on  Analysis of Langmuir Probe Data Using Wavelet Transform 4134
2004  Key Engineering Materials  Measurement of Monodisperse Particle Charge in DC Plasma 6273
2004  Surface and Coatings Technology  Time-resolved plasma measurement in a high-power pulsed ICP source for large area 4510
2002  Surface and Coatings Technology  The effect of plasma exposure and annealing atmosphere on shallow junction formation using plasma source ion implantation 5364
2002  Journal of Applied Physics  Measurement of expanding plasma sheath from a target baised by a negative pulse with a fast rise time 103673
2001  Journal of applied physics  Electrostatic probe diagnostic of a planar type radio-frequency inductively coupled oxgen plasma 5650
2001  IEEE Transactions On Plasma Science  Scaling Characteristics of Plasma Parameters for Low-Pressure Oxygen RF Discharge plasmas 4185
2001  Japanese journal of applied physics  Plasma Source Ion Implantation for Ultrashallow Junctions: Low Energy and High Dose Rate 4941
2001  Surface & Coating Technology  The measurement of nitrogen ion species ratio in the inductively coupled plasma source ion implantation 7059
2001  Surface & Coating Technology  Measurement of sheath expansion in plasma source ion implantation 9760

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