연도 2019 
저널명 Plasma Physics and Controlled Fusion 
Plasma Phys. Control. Fusion 

Application of of PI-VM for management of the metal target plasma etching processes in OLED display manufacturing

주저자: Seolhye Park

S. Park, Plasma Phy. Control. Fusion 61 (2019) 014032 (9pp)

연도 저널명 제목 조회 수
2001  Journal of the Korean Physical Society  Characterization of Oxygen Plasma by Using the Langmuir Probe in an Inductively Coupled Plasma 16382
2001  Current Applied Physics  Calculation of transport parameters in KT-1 tokamak edge plasma 83242
2000  Plasma sources science & technology  Asymmetric plasma potential fluctuation in an inductive plasma source 6010
2000  REVIEW OF SCIENTIFIC INSTRUMENTS  Effect of harmonic rf fields on the emissive probe characteristics 5332
2000  Plasma sources science & technology  Design and operation of an Omegatron mass spectrometer for measurements of positive and negative ion species in electron cyclotron resonance plasmas 4878
2000  Applied physics letters  Influence of Electrode-Size Effects on Plasma Sheath Expansion 7308
1999  Journal of aerosol science  Charge measurement on monodisperse particles in a DC glow discharge plasma 4667
1999  Physics of Plasma  Ion sheath expansion for a target voltage with a finite risetime 8619
1998  Physics of Plasmas  Azimuthally Symmetric Pseudosurface and Helicon Wave Propagation in an Inductively Coupled Plasma at Low Magnetic Field 7634
1997  Surface & Coating Technology  Polymer Surface Modification by Plasma Source Ion Implantation 6963
1995  Journal of applied physics  A Two-Dimensional Particle-In-Cell Simulation of an Electron-Cyclotron-Resonance Etching Tool 5320
1995  Physics of Plasmas  Magnetic and Collisional Effects on Presheaths 5973
1993  Review of scientific instruments  Direct Measurement of Plasma Flow Velocity Using a Langmuir Probe 4087
1993  Journal of Vacuum Science & Technology  Role of contaminants in electron cyclotron resonance plasmas 5392
1993  Journal of Vacuum Science & Technology  Two-Dimensional Mapping of Plasma Parameters Using Probes in an Electron Cyclotron Resonance Etching Device 4612

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