연도 2000 
저널명 Plasma sources science & technology 
 

Time-averaged plasma potential in an inductive source with a ground wall has been measured by using an emissive probe. The inflection point method in the limit of zero emission is employed to determine the plasma potential. In this source, capacitive coupling results in a fluctuating plasma potential. The peak-to-peak value of the radiofrequency (RF) fluctuations, which is approximately given by the separation of the two peaks in the derivative of an I -V characteristic curve, has been reduced by introducing a gap between the antenna and the quartz window and by various electrostatic screens. Experimental data show that the lower potential peak, representing the lowest plasma potential, was approximately constant as the RF fluctuation level was reduced, while the higher potential peak, indicating the more positive plasma potential, changed and approached the lower potential peak. For very low fluctuation level, the lower potential peak becomes the dc plasma potential and only the higher potential peak responds to the RF fluctuation.


https://doi.org/10.1088/0963-0252/9/1/302

연도 저널명 제목 조회 수
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1998  Physics of Plasmas  Azimuthally Symmetric Pseudosurface and Helicon Wave Propagation in an Inductively Coupled Plasma at Low Magnetic Field 7625
1997  Surface & Coating Technology  Polymer Surface Modification by Plasma Source Ion Implantation 6958
1995  Journal of applied physics  A Two-Dimensional Particle-In-Cell Simulation of an Electron-Cyclotron-Resonance Etching Tool 5309
1995  Physics of Plasmas  Magnetic and Collisional Effects on Presheaths 5964
1993  Review of scientific instruments  Direct Measurement of Plasma Flow Velocity Using a Langmuir Probe 4075
1993  Journal of Vacuum Science & Technology  Role of contaminants in electron cyclotron resonance plasmas 5385
1993  Journal of Vacuum Science & Technology  Two-Dimensional Mapping of Plasma Parameters Using Probes in an Electron Cyclotron Resonance Etching Device 4601

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